Birefrince Characteristics of an Optical Element
R. Suganya1, S. Bharanidharan2, R. Sreelatha3
1R.Suganya Department of Physics, Bharath Institute of Higher Education and Research (BIHER), Chennai India.
2Dr. S. Bharanidharan Department of Physics, Bharath Institute of Higher Education and Research (BIHER), Chennai India.
3Dr. R. Sreelatha Department of Physics, Bharath Institute of Higher Education and Research (BIHER), Chennai India.
Manuscript received on 05 July 2019 | Revised Manuscript received on 18 July 2019 | Manuscript Published on 23 August 2019 | PP: 801-803 | Volume-8 Issue-9S3 August 2019 | Retrieval Number: I31660789S319/2019©BEIESP | DOI: 10.35940/ijitee.I3166.0789S319
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© The Authors. Blue Eyes Intelligence Engineering and Sciences Publication (BEIESP). This is an open-access article under the CC-BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)
Abstract: Phase difference variation in uniaxial crystal is investigated for varying thickness. Using double refraction property and optic axis method leads to the intensity measurement. The periphery example got when a unique (or focalized) shaft experiences an example of birefringent gem between two polarizers contains data which is intrinsic of the crystalline example under examination.
Keywords: Uniaxial crystal, Phase difference, Intensity and Thickness.
Scope of the Article: Optical Communication