Non-Invasive Fruit Analyser_1.7
S. Vijayachitra1, Hariprasanna. E2, Haripriya. S3, Kavin. V. S4, Mohan Ranjith. P5
1Dr.S.Vijayachitra*, Department of Electronics and Instrumentation Engineering, Kongu Engineering College, Perundurai.
2Hariprasanna.E, Department of Electronics and Instrumentation Engineering, Kongu Engineering College, Perundurai.
3Haripriya.S, Department of Electronics and Instrumentation Engineering, Kongu Engineering College, Perundurai.
4Kavin.V.S,, Department of Electronics and Instrumentation Engineering, Kongu Engineering College, Perundurai.
5Mohan Ranjith.P, Department of Electronics and Instrumentation Engineering, Kongu Engineering College, Perundurai.
Manuscript received on February 10, 2020. | Revised Manuscript received on February 23, 2020. | Manuscript published on March 10, 2020. | PP: 1567-1570 | Volume-9 Issue-5, March 2020. | Retrieval Number: E2756039520/2020©BEIESP | DOI: 10.35940/ijitee.E2756.039520
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© The Authors. Blue Eyes Intelligence Engineering and Sciences Publication (BEIESP). This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)
Abstract: Fruit quality is an important parameter in the food processing industries. It is necessary to analyze internal and external characteristics of the fruit sample. Standardizing the quality of fruit in Agro industries is essential. There is a need of standardizing equipment of affordable price because it involves huge man power. In this project, quality of the fruit is analyzed based on the capacitor concept in which the fruit will act as a dielectric medium between two parallel plates. The obtained output voltage is proportional to the condition of the fruit sample. The color variation in the outer layer of the sample is also determined using the image processing techniques. To find the quality, it is also that considered volume and weight as important parameters. All these three data are combined together in order to give the desired results at an affordable price. This product will also reduce the labor cost and the losses possibly occurred due to the destructive analysis and so on.
Keywords: Capacitor, Parallel Plate ,RGB Sensor, Load Cell.
Scope of the Article: Parallel and Distributed Algorithms