A Novel Method for Detecting Parametric Faults in Analog Circuits using Fuzzy Logic
Karthi S. P.1, Kavitha K.2, Dinesh Kumar J. R.3
1Karthi S P*, Assistant Professor, Department of ECE, Sri Krishna College of Engineering and Technology, Coimbatore, Tamil Nadu, India.
1Kavitha K, Professor, Department of ECE, Kumaraguru College of Technology Coimbatore, Tamil Nadu, India.
3Dinesh Kumar J. R., Assistant Professor, Department of ECE, Sri Krishna College of Engineering and Technology, Coimbatore, Tamil Nadu, India.
Manuscript received on December 12, 2019. | Revised Manuscript received on December 22, 2019. | Manuscript published on January 10, 2020. | PP: 3404-3407 | Volume-9 Issue-3, January 2020. | Retrieval Number: C8883019320/2020©BEIESP | DOI: 10.35940/ijitee.C8883.019320
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© The Authors. Blue Eyes Intelligence Engineering and Sciences Publication (BEIESP). This is an open access article under the CC-BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)
Abstract: The demand for testability analysis of analog circuits has been increased in recent years. The fault detection and fault classification method is important in detecting the parametric faults of the circuit. In this paper, Simulation Before Test (SBT) is considered as a basic mechanism for detecting the parametric faults.. The circuit Under Test (CUT) used is Sallen-Key bandpass filter. Transfer function of the CUT is used for fault detection by locating the poles and Zeros of the transfer function. Fuzzy logic is used for fault classification.
Keywords: SBT, CUT and Fuzzy Logic.
Scope of the Article: Fuzzy Logic