Efficient and Convenient Application to Determine the Functions and Analysis of the Reliability of the Device
Aslonov Q. Z.1, Zhalilov R. B.2, Mukhamadieva Z. B.3, Safarov A. B.4, Mamedov R. A.5
1Aslonov Qodir Ziyodullayevich*, Ph.D. Student of Information Communications Technology Department, Bukhara Engineering Technological Institute, Bukhara, Uzbekistan.
2Zhalilov Rashid Babakulovich, Associate Professor at the Department of Energy, Bukhara Engineering Technological Institute, Bukhara, Uzbekistan.
3Mukhamadieva Zarina Bakhodirovna, Ph.D. Student of Information communications technology Department, Bukhara Engineering Technological Institute, Bukhara, Uzbekistan.
4Safarov Alisher Bekmurodovich, Ph.D. Student of Energy audit Department, Bukhara Engineering Technological Institute, Bukhara, Uzbekistan
5Mamedov Rasul Akif-ogli, Ph.D. Student of Energy department, Bukhara Engineering Technological Institute, Bukhara, Uzbekista
Manuscript received on November 15, 2019. | Revised Manuscript received on 20 November, 2019. | Manuscript published on December 10, 2019. | PP: 1804-1809 | Volume-9 Issue-2, December 2019. | Retrieval Number: B7323129219/2019©BEIESP | DOI: 10.35940/ijitee.B7323.129219
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© The Authors. Blue Eyes Intelligence Engineering and Sciences Publication (BEIESP). This is an open access article under the CC-BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)
Abstract: The article describes the types of distribution laws that can be used to determine the reliability of the device (element), analyzed the most frequently used methods for calculating the reliability. When calculating the reliability functions, the modern programming language “Swift” is used and their algorithms are described.
Keywords: Probability of Uptime, Probability of Failure, Average Uptime, Failure rate.
Scope of the Article: Process & Device Technologies